CMM TRIGGER AND SCANNING PROBE

Manual Probe

• Enhanced inspection capability from adjustable probe orientation with 168 repeatable index positions set at 15°increments

• Repeatable TP20 stylus module changing in each pre-qualified position without the need for re-qualification significantly enhances productivity.

• TP20 compatibility, providing a wide range of force and length options to optimise machine performance and access capability.

• Easy to read scales allow rapid re-orientation.

Auto Probe

• Total angular movement 

• Around A axis（Horizontal axis）: Range: 0°～105°  Min.step:7.5°

• Around B axis（Vertical axis）: Range: ±180°   Min. step: 7.5°

• Total number of positions: 720

• Max. output torque: 0.45Nm

• Max. permissible length of the probe extension:300 mm

• Weight: 645g

• Autojoint mount, repeatable probe positioning 

• Rapid automatic probe interchange via ACR1 or ACR3

• Full multi-wire capability (designed by the M on PH10M)

• 720 repeatable positions at 7.5° increments

• Torque capable of lifting 300mm(11.81 in) extension bar

• Suitable for a wide range of CMMs using shank or quill mounting

• I++ DME communication, wide selection of metrology software.

• No requirement to modify existing programs in the majority of cases

• Allows re-use of existing equipment.

• Rotation angles: A axis -115°～115°; B axis ∞

• The world’s most compact and versatile scanning probe system

• A scanning probe, and a touch trigger probe using TP20 stylus modules.

• Rapid and repeatable interchange between highly modular system elements provides the most efficient solution to suit the measurement task

• Excellent scanning accuracy across entire stylus range of 20~200mm (0.78~7.87 in)

• Isolation optical metrology technology gives unrivalled measurement performance.

• Probe can be mounted on an articulating head, allowing access to many features with fewer styli.

• Fast measurement speed

• The system has high precision

• Strong flexibility

• Axial extension of up to 800 mm from the base rotation center

• Multi-type sensor probe and stylus exchange capability

• Detachable probe system with low-cost exchange frame for increased system flexibility